James A Kyle

Title: Innovations of James A. Kyle in Analog Testing

Introduction

James A. Kyle is an accomplished inventor based in Germantown, NY (US). He is known for his significant contributions to the field of analog testing, particularly in the development of systems that enhance the testing of ring oscillators. His work has been instrumental in advancing the efficiency and effectiveness of testing procedures in integrated circuits.

Latest Patents

James A. Kyle holds a patent for "Analog testing of ring oscillators using built-in self-test apparatus." This innovative patent describes a system-accessible frequency measuring circuit that allows for on-chip testing of oscillators. The test results can be observed off-chip via LSSD scan paths, enabling a rapid ensemble of ring oscillators in a standard ASIC test flow. This invention eliminates the need for on-chip analog test equipment, as the test apparatus is effectively created on the device itself and can be digitally configured, operated, and read. The frequency measuring logic can functionally measure the frequency of the ring oscillators, participate in traditional logical tests, and operate in a special ring-oscillator test mode.

Career Highlights

James A. Kyle is associated with the International Business Machines Corporation (IBM), where he has made significant contributions to the field of electronics and testing methodologies. His innovative approach has led to advancements that streamline the testing process for integrated circuits, making it more efficient and reliable.

Collaborations

Throughout his career, James has collaborated with notable colleagues, including Joseph E. Eckelman and Kevin C. Gotze. These collaborations have fostered an environment of innovation and have contributed to the development of cutting-edge technologies in the field.

Conclusion

James A. Kyle's contributions to analog testing and his innovative patent have significantly impacted the field of electronics. His work continues to influence the way integrated circuits are tested, ensuring higher reliability and efficiency in electronic devices.