This inventor holds 1 USPTO granted patent. Top assignee: Micro-Epsilon Messtechnik Gmbh & Co. Kg. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Innovations of Jakob Stieß in Contactless Measurement Technology
Introduction
Jakob Stieß is an accomplished inventor based in Fürstenzell, Germany. He has made significant contributions to the field of measurement technology, particularly in the development of devices that enable contactless distance and position determination of measurement objects. His innovative approach has led to the creation of a patented device that utilizes advanced sensor technology.
Latest Patents
Jakob Stieß holds a patent for a "Device and sensor for contactless distance and/or position determination of a measurement object." This device is designed to work with electrically conductive measurement objects and employs sensors that operate based on inductive, capacitive, or eddy current principles. The unique aspect of his invention is that the measurement device is formed by at least two measurement elements that are spatially separated from each other, enhancing the accuracy and reliability of the measurements.
Career Highlights
Jakob Stieß is currently associated with Micro-Epsilon Messtechnik GmbH & Co. KG, a company renowned for its expertise in measurement technology. His work at Micro-Epsilon has allowed him to further develop his innovative ideas and contribute to the advancement of contactless measurement solutions.
Collaborations
Jakob has collaborated with notable colleagues, including Reinhold Hoenicka and Tobias Schopf. Their combined expertise has fostered a collaborative environment that encourages innovation and the development of cutting-edge measurement technologies.
Conclusion
Jakob Stieß's contributions to contactless measurement technology exemplify the spirit of innovation in the field. His patented device represents a significant advancement in measurement techniques, showcasing his dedication to improving technology for practical applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
