Vries, Netherlands

Jakob Korf

This inventor holds 2 USPTO granted patents. Top assignee: Other. Active years: 1998-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jakob Korf. Retrieved from https://idiyas.com/inventor/jakob-korf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 15(Granted Patents)


Location History:

  • Vriea, NL (1998)
  • Vries, NL (2000)

Company Filing History:

goldMedal2 out of 834,513 
Other
 patents

Years Active: 1998-2000

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2 patents (USPTO):Explore Patents

Title: Innovations of Jakob Korf

Introduction

Jakob Korf is a notable inventor based in Vries, Netherlands. He has made significant contributions to the field of monitoring substances in physiological fluids. With a total of 2 patents, Korf's work reflects his dedication to advancing technology in health monitoring.

Latest Patents

Jakob Korf's latest patents include innovative methods for monitoring the concentration of a substance or a group of substances. He has also developed a non-invasive technique for monitoring constituents of physiological fluids. These patents showcase his commitment to improving health diagnostics through technology.

Career Highlights

Throughout his career, Korf has focused on creating solutions that enhance the accuracy and efficiency of health monitoring systems. His inventions are aimed at providing better healthcare outcomes through advanced monitoring techniques.

Collaborations

Jakob Korf has collaborated with notable professionals in his field, including Thomas Henricus Terwee and Jaep De Boer. These partnerships have contributed to the development of his innovative patents.

Conclusion

Jakob Korf's contributions to the field of health monitoring through his patents demonstrate his innovative spirit and commitment to improving healthcare technology. His work continues to influence advancements in non-invasive monitoring techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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