Cincinnati, OH, United States of America

Jagdish Patel

This inventor holds 1 USPTO granted patent. Top assignee: Palmer Instruments, Inc.. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jagdish Patel. Retrieved from https://idiyas.com/inventor/jagdish-patel-tn0gh6vl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: Jagdish Patel: Innovator in Thermometer Technology

Introduction

Jagdish Patel is a notable inventor based in Cincinnati, OH (US). He has made significant contributions to the field of thermometer technology, particularly with his innovative designs that enhance usability and accuracy.

Latest Patents

Patel holds a patent for a "Universal mounting for bi-metallic thermometer." This invention features a case connector that is secured to the underside of the thermometer case and a stem connector at the uppermost end of the stem. The design allows the case connector to be telescopingly received within the stem connector, making it rotatably adjustable. Additionally, the invention includes means to lock the case connector in any desired rotative position. This allows for easy reading of the calibrated scale and facilitates the removal or replacement of the thermometer components.

Career Highlights

Jagdish Patel is currently associated with Palmer Instruments, Inc., where he continues to innovate and develop new technologies in the field of thermometers. His work has been instrumental in improving the functionality and user experience of bi-metallic thermometers.

Conclusion

Jagdish Patel's contributions to thermometer technology exemplify the spirit of innovation. His patent for a universal mounting system showcases his commitment to enhancing the usability of measurement instruments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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