Asan, South Korea

Jaehak Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jaehak Lee. Retrieved from https://idiyas.com/inventor/jaehak-lee-zlofroig

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jaehak Lee and Display Panel Testing Innovation.

Introduction

Jaehak Lee is an inventor based in Asan, South Korea. His work includes a patented display-panel design that integrates a test circuit into the panel structure. Lee is associated with Samsung Display Co., Ltd.

Latest Patents

Lee is credited with 1 patent: “Display Panel Having Test Circuit and Display Device Including the Same.” The invention describes a display panel with a base layer divided into first and second regions. A pixel and its electrically connected line are arranged so the line extends from the first region into the second. The panel also includes an external-signal pad beneath the base layer’s top surface and a test circuit in the second region, spaced from the first region and positioned farther from it than the pad. The design concerns the placement of testing components within a display panel.

Career Highlights

Lee’s listed patent reflects work on display-device architecture and panel testing. His association with Samsung Display connects his inventive work to a company focused on display technologies.

Collaborations

Lee’s listed coworker is Si Joon Song. The available information identifies their professional association but does not specify the nature of their collaboration on the patent.

Conclusion

Jaehak Lee’s patent describes a display panel that incorporates a test circuit alongside pixels, signal lines, and an external-input pad, highlighting his contribution to display-device design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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