Suwon, South Korea

Jae-Yun Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae-Yun Lee. Retrieved from https://idiyas.com/inventor/jae-yun-lee-hvbggujs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jae-Yun Lee: Inventor in Nonvolatile Memory Technology

Introduction

Jae-Yun Lee is an inventor based in Suwon, South Korea, and works at Samsung Electronics Ltd. His patent work concerns nonvolatile memory devices and their initialization.

Latest Patents

The provided information lists one patent for Lee: “Nonvolatile Memory Device, Method of Controlling Initialization of Nonvolatile Memory Device, and Storage Device.” The invention describes a memory cell array that stores setting data, a page buffer circuit, and control logic. The control logic senses first setting data and transfers it to a setting buffer, then uses that data to guide the sensing of second setting data. This staged process supports initialization control in a nonvolatile memory device.

Career Highlights

Lee’s listed patent reflects work on memory-device architecture and control methods. The supplied information identifies Samsung Electronics Ltd. as his employer and records 1 patent.

Collaborations

The provided data names Yo Han Lee and Sang Soo Park as Lee’s coworkers. It does not specify their roles in the patent or describe any direct collaboration.

Conclusion

Jae-Yun Lee’s documented invention focuses on controlling the sensing and initialization of setting data in nonvolatile memory, contributing to the broader field of memory technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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