Seoul, South Korea

Jae Yong Shin

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Evertri. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Yong Shin. Retrieved from https://idiyas.com/inventor/jae-yong-shin-jppxw2i6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jae Yong Shin and Data-Driven Atopic Dermatitis Management

Introduction

Jae Yong Shin is an inventor based in Seoul, South Korea. His patent work includes an approach to managing atopic dermatitis using a learning model and patient-specific data.

Latest Patents

Shin is associated with 1 patent: “Apparatus for Managing Atopic Dermatitis Based on Learning Model and Method Therefor.” The invention describes collecting patient data on daily-life factors, biometric measures, mental health, skin condition, weather-related environmental conditions, and medically recorded atopic dermatitis severity. A learning model evaluates relationships between the severity index and detailed variables, selects relevant variables for each factor, and uses updated patient data to predict the severity index.

Career Highlights

Shin is associated with Evertri. His patent describes applying machine learning to combine multiple types of patient information for atopic dermatitis management.

Collaborations

Joo Young Oh and Sang Eun Lee are identified as Shin’s coworkers. The available information does not specify their roles in the patent or the invention.

Conclusion

Jae Yong Shin’s patent presents a data-driven method for predicting atopic dermatitis severity, drawing on patient health, lifestyle, skin, and environmental information.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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