Gimpo-si, South Korea

Jae Woong Ahn

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Korea University Research and Business Foundation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Woong Ahn. Retrieved from https://idiyas.com/inventor/jae-woong-ahn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jae Woong Ahn and Display Pixel Compensation Technology.

Introduction

Jae Woong Ahn is an inventor associated with Gimpo-si, South Korea, and the Korea University Research and Business Foundation. His patent work includes a display pixel compensation circuit designed to improve the accuracy and efficiency of pixel correction.

Latest Patents

Ahn’s patent, “Display Pixel Compensation Circuit Device Using Dual Slope,” describes a circuit that measures a target pixel’s driving thin-film transistor current while separately sensing panel noise on an adjacent sensing line. Dual-slope error-detection circuitry uses the two measurements to determine a pixel error, represent it as a sign and an error value, and store those values in memory. In subsequent frames, the circuit adds or subtracts the error value from the digital pixel signal according to its sign. This approach enables real-time, multi-bit correction while reducing silicon area and improving power efficiency.

Career Highlights

Ahn is associated with the Korea University Research and Business Foundation. The provided information identifies one patent in his portfolio.

Collaborations

The available information connects Ahn’s patent work with the Korea University Research and Business Foundation. No additional collaborators are specified in the provided details.

Conclusion

Jae Woong Ahn’s patented dual-slope compensation circuit addresses pixel accuracy, panel-noise measurement, and efficient correction in display systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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