Incheon, South Korea

Jae Sun Park

This inventor holds 1 USPTO granted patent. Top assignee: Daewoo Heavy Industries Ltd.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Sun Park. Retrieved from https://idiyas.com/inventor/jae-sun-park-x1quknqq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Innovations by Jae Sun Park

Introduction

Jae Sun Park is an accomplished inventor based in Incheon, South Korea. She has made significant contributions to the field of forklift technology through her innovative ideas and patents. Her work focuses on enhancing the efficiency and functionality of forklift trucks.

Latest Patents

Jae Sun Park holds a patent for a self-diagnostic method for a forklift truck. This method allows for the selective testing of various components of the forklift, displaying the results collectively on a display after completing the tests. It also enables a quick test mode during the run mode by manipulating the accelerator pedal and direction lever. The method includes several steps, such as providing a mode selector, initiating a main routine by the controller, and displaying error codes when failures are detected.

Career Highlights

Jae Sun Park is currently employed at Daewoo Heavy Industries Ltd., where she continues to develop innovative solutions for heavy machinery. Her expertise in diagnostics and control systems has positioned her as a valuable asset in her field.

Conclusion

Jae Sun Park's contributions to forklift technology through her patent demonstrate her commitment to innovation and improvement in industrial machinery. Her work not only enhances operational efficiency but also sets a standard for future developments in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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