Santa Clara, CA, United States of America

Jae Shin Yoon

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Nvidia Corporation. Active years: 2023.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Jae Shin Yoon: Innovator in View Synthesis Technology

Introduction

Jae Shin Yoon is a prominent inventor based in Santa Clara, CA (US). He has made significant contributions to the field of view synthesis, particularly in dynamic scenes. His innovative work has led to the development of advanced techniques that enhance image processing and depth perception.

Latest Patents

Jae Shin Yoon holds a patent for "View synthesis for dynamic scenes." This patent presents apparatuses, systems, and techniques designed to perform monocular view synthesis of a dynamic scene. The technology allows for the determination of single and multi-view depth information from a collection of images. A blender network is utilized to combine image features for foreground, background, and missing image regions, using fused depth maps inferred from the depth information.

Career Highlights

Yoon is currently employed at Nvidia Corporation, a leading company in graphics processing and artificial intelligence. His work at Nvidia has positioned him at the forefront of technological advancements in image synthesis and processing.

Collaborations

Throughout his career, Jae Shin Yoon has collaborated with notable colleagues, including Jan Kautz and Kihwan Kim. These partnerships have further enriched his research and development efforts in the field.

Conclusion

Jae Shin Yoon's contributions to view synthesis technology exemplify his innovative spirit and dedication to advancing image processing techniques. His work continues to influence the industry and inspire future developments in this area.

Profile summary based on public USPTO records.
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