Jae Seok Choi

Title: Jae Seok Choi: Innovator in Substrate Measurement Technology

Introduction

Jae Seok Choi is a prominent inventor based in Bucheon-si, South Korea. He has made significant contributions to the field of substrate measurement technology. His innovative approach has led to the development of a unique on-line measuring system that enhances the accuracy of substrate thickness measurement.

Latest Patents

Jae Seok Choi holds 1 patent for his invention titled "On-line measuring system for measuring substrate thickness and the method thereof." This system includes a first image detector, a second image detector, an elevator, and a display device. The first image detector identifies vertical variations of the substrate's bottom surface, while the second image detector captures an image of that surface. The elevator adjusts the position of the second image detector to maintain a constant vertical distance from the substrate, allowing for precise thickness calculations.

Career Highlights

Choi is currently employed at Samsung Corning Co., Ltd., where he continues to innovate and develop new technologies. His work has been instrumental in advancing the capabilities of substrate measurement systems, making them more efficient and reliable.

Collaborations

Some of his notable coworkers include Jong Eun Ha and Taek Cheon Kim, who have collaborated with him on various projects within the company.

Conclusion

Jae Seok Choi's contributions to substrate measurement technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to enhancing measurement accuracy, which is crucial in various industrial applications.