Seongnam, South Korea

Jae Moon Jung

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Ilooda Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Moon Jung. Retrieved from https://idiyas.com/inventor/jae-moon-jung-4w1sbf19

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Jae Moon Jung: Innovator in Temperature Measurement Technology

Introduction

Jae Moon Jung is a notable inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of temperature measurement technology. His innovative approach focuses on creating devices that are both cost-effective and efficient.

Latest Patents

Jae Moon Jung holds a patent for a "Temperature measuring device for tracked subject target region." This invention relates to a non-contact temperature measuring device that offers a simpler configuration at a lower cost compared to traditional thermal imaging cameras. The device utilizes a general camera to recognize a movable target object and accurately measure its temperature. It is designed to correct errors based on the distance or angle from the target, ensuring precise temperature readings.

Career Highlights

Jae Moon Jung is associated with Ilooda Co., Ltd., where he applies his expertise in developing innovative measurement technologies. His work has garnered attention for its practical applications in various industries.

Collaborations

Jae Moon Jung collaborates with talented individuals such as Sang Joon Lee and Dong Wook Kim. Their combined efforts contribute to the advancement of technology in their field.

Conclusion

Jae Moon Jung's contributions to temperature measurement technology exemplify innovation and practicality. His patent reflects a commitment to improving measurement accuracy while reducing costs. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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