Company Filing History:
4 out of 1,021 Years Active: 2009-2011
Title: Innovations of Jae Mok Yi
Introduction
Jae Mok Yi is a notable inventor based in Gyeongsangbuk-do, South Korea. He has made significant contributions to the field of imaging and defect characterization in materials science. With a total of two patents to his name, his work has advanced the understanding of structural defects in single crystal materials.
Latest Patents
Jae Mok Yi's latest patents include a method of bright-field imaging using X-rays. This method reveals lattice defects and structural inhomogeneities in a sample. The process involves disposing a sample on a holder in Laue transmission geometry and setting it to a single reflection in Bragg diffraction. A beam of monochromatic X-rays is projected onto the sample, and transmitted radiographic images, along with reversed diffracted images, are obtained.
Another significant patent is the characterization of the three-dimensional distribution of defects by X-ray topography. This method determines the three-dimensional distribution of structural defects in a single crystal material. It includes disposing a single crystal sample on a holder, projecting a beam of incident X-rays on a predetermined crystal plane, and obtaining geometrical measured values of a two-dimensional configuration of defects on a CCD detector. The three-dimensional distribution of defects is then formulated based on the geometrical relation between the configurations.
Career Highlights
Jae Mok Yi has worked with reputable organizations such as the Postech Foundation and the Postech Academy-Industry Foundation. His experience in these institutions has allowed him to collaborate with other experts in the field and contribute to innovative research.
Collaborations
One of his notable collaborators is Jung Ho Je. Their partnership has likely fostered advancements in their respective research areas.
Conclusion
Jae Mok Yi's contributions to the field of imaging and defect characterization are noteworthy. His innovative patents reflect his expertise and commitment to advancing materials science. His work continues to influence the understanding of structural defects in single crystal materials.