The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Jul. 12, 2006
Applicants:
Jung Ho Je, Gyeongsangbuk-do, KR;
Jae Mok Yi, Gyeongsangbuk-do, KR;
Inventors:
Jung Ho Je, Gyeongsangbuk-do, KR;
Jae Mok Yi, Gyeongsangbuk-do, KR;
Assignees:
Postech Foundation, , KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising: (a) disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction; (b) projecting a beam of monochromatic x-rays on the sample; and (c) obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively.