Yongin-si, South Korea

Jae Joong Kwon

This inventor holds 2 USPTO granted patents. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Joong Kwon. Retrieved from https://idiyas.com/inventor/jae-joong-kwon-utfk99rp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Jae Joong Kwon

Introduction

Jae Joong Kwon is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of light measurement technology. His innovative approach has led to the development of a unique light measuring device that enhances the accuracy and efficiency of light measurement.

Latest Patents

Jae Joong Kwon holds a patent for a light measuring device. This device includes a first lens, a first variable opening, a second lens, a second variable opening, a third lens, and a light receiving unit. The design allows for independent adjustment of the diameters of the first and second variable openings, which improves the device's functionality.

Career Highlights

Kwon is currently employed at Samsung Display Co., Ltd., where he continues to work on innovative projects. His expertise in light measurement technology has positioned him as a valuable asset to his team and the company.

Collaborations

Some of his coworkers include A Ree Song and Ha Young Lee, who collaborate with him on various projects within the company.

Conclusion

Jae Joong Kwon's contributions to light measurement technology exemplify the spirit of innovation. His work at Samsung Display Co., Ltd. and his patented inventions highlight his commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…