Watervliet, NY, United States of America

Jae Hwan Lee

This inventor holds 1 USPTO granted patent. Top assignee: United States of America as Represented by the Secretary of the Air Force. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Hwan Lee. Retrieved from https://idiyas.com/inventor/jae-hwan-lee-b3d69lkk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jae Hwan Lee and Machine Learning for Mass Spectrometry.

Introduction

Jae Hwan Lee is an inventor associated with Watervliet, New York, and the United States of America as Represented by the Secretary of the Air Force. His work includes an invention applying machine learning to improve mass spectrometry.

Latest Patents

Lee is associated with 1 patent, titled “Method of Improving a Mass Spectrometer, Module for Improving a Mass Spectrometer and an Improved Mass Spectrometer.” The invention describes using machine learning to reduce the number of false positives and shorten the time needed to eliminate them, potentially to a few hours. It also describes integrating the method into a mass spectrometer by adding a programmed computer module to the instrument’s computer system.

Career Highlights

The patent highlights Lee’s contribution to applying machine learning in analytical instrumentation. Its proposed approach aims to make the process of identifying and eliminating false positives more efficient.

Collaborations

Lee’s listed coworkers include Mitchell H. Rubenstein and Christin M. Duran. The patent is associated with the United States of America as Represented by the Secretary of the Air Force.

Conclusion

Jae Hwan Lee’s patent presents a machine-learning-based approach to improving mass spectrometry by helping reduce false positives and the time required to address them.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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