Seoul, South Korea

Jae Heon Kim

This inventor holds 1 USPTO granted patent. Top assignee: Industry-Academic Cooperation Foundation of Sunchon National University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Heon Kim. Retrieved from https://idiyas.com/inventor/jae-heon-kim-ap786adc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jae Heon Kim: Advancing Smart-Farm Crop Analysis

Introduction

Jae Heon Kim is an inventor based in Seoul, South Korea. His work includes a patent for analyzing crop growth and exploring plant phenotypes using multiple types of composite images.

Latest Patents

Kim is named on one patent: “Apparatus for Analyzing Crop Growth Information Through Multiple Composite Images and Method for Exploring Plant Phenotypes Using the Same.” The invention uses RGB, thermal-imaging, and hyperspectral cameras to capture crop information. It combines image analysis to distinguish crop phenotypes and assess characteristics such as vegetation indices and water stress. This approach can help growers select and cultivate crop varieties suited to the local region, climate, and terrain of a smart farm.

Career Highlights

Kim is associated with the Industry-Academic Cooperation Foundation of Sunchon National University. His patented work applies imaging technologies to crop monitoring and phenotype analysis, with the aim of supporting more informed cultivation decisions and improving smart-farm productivity.

Collaborations

The supplied information identifies Meong Hun Lee and Hyun Yoe as Kim’s coworkers.

Conclusion

Jae Heon Kim’s patent brings together RGB, thermal, and hyperspectral imaging to help analyze crop growth and identify plant traits, contributing to technology development for smart farming.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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