Yongin, South Korea

Jae-han Lee

This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae-han Lee. Retrieved from https://idiyas.com/inventor/jae-han-lee-myvh1iio

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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3 patents (USPTO):Explore Patents

Title: Jae-han Lee and Display Technology Innovation.

Introduction

Jae-han Lee is an inventor based in Yongin, South Korea, whose patent work focuses on display systems and electronic devices. The supplied information lists 3 patents and identifies Samsung Display Co., Ltd. as his company.

Latest Patents

Lee’s listed patent work includes a display-driving circuit and display device with circuitry for detecting defects. The design uses sense amplifiers to measure voltages associated with neighboring data lines, then compares an input voltage with a reference voltage to generate a shutdown signal when the comparison indicates a potential defect.

Another listed invention concerns an electronic device with a display panel and data driver. It describes two operating modes: in the first, the data driver supplies data voltages to the panel’s data lines; in the second, a switch part connects the lines to a predetermined voltage.

Career Highlights

The available information associates Lee’s display-related patent work with Samsung Display Co., Ltd. His listed inventions address display driving, voltage control, and defect detection.

Collaborations

Wontae Kim is identified as a coworker. The supplied information does not specify the nature of their collaboration on these inventions.

Conclusion

Jae-han Lee’s listed patents reflect work on display-device circuitry, including data-line voltage management and defect detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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