Seongnam, South Korea

Jae-Hak Lee

This inventor holds 2 USPTO granted patents. Top assignee: Isc Co., Ltd.. Active years: 2016-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae-Hak Lee. Retrieved from https://idiyas.com/inventor/jae-hak-lee-iyomokje

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2016-2017

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2 patents (USPTO):Explore Patents

Title: The Innovations of Jae-Hak Lee

Introduction

Jae-Hak Lee is a prominent inventor based in Seongnam-si, South Korea. She has made significant contributions to the field of semiconductor testing through her innovative designs. With a total of 2 patents, her work has garnered attention in the technology sector.

Latest Patents

Jae-Hak Lee's latest patents include a probe member for a pogo pin, which is essential for testing semiconductor devices. This probe member is designed to be inserted into a cylindrical body, supported by an elastic member, with its upper end making contact with the terminal of the semiconductor device. The design ensures precision and reliability in testing, which is crucial for the performance of semiconductor components.

Career Highlights

Throughout her career, Jae-Hak Lee has been associated with Isc Co., Ltd., where she has played a vital role in advancing semiconductor testing technologies. Her expertise and innovative mindset have contributed to the development of efficient testing solutions that meet industry standards.

Conclusion

Jae-Hak Lee's contributions to the field of semiconductor testing through her patents highlight her role as a leading inventor. Her work continues to influence the technology landscape, showcasing the importance of innovation in advancing industry practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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