Ningbo, China

Jacques Wang

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Victor Equipment Company. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jacques Wang. Retrieved from https://idiyas.com/inventor/jacques-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Jacques Wang - Innovator in Surface Detection Technology.

Introduction

Jacques Wang is a notable inventor based in China, recognized for his contributions to the field of surface detection technology. He has developed innovative solutions aimed at improving the quality and precision of work piece surfaces. His work reflects a commitment to advancing manufacturing processes through technological innovation.

Latest Patents

Jacques Wang holds a patent for the "Air-Carbon Arc System For Detecting And/or Reducing Irregularities In A Work Piece Surface And Method Of Using The Same." This system includes a control box, a torch head operationally connected to the control box, and a pendant that helps in reducing irregularities in the work piece surface. Although he currently has 1 patents, his work demonstrates significant potential for future innovations.

Career Highlights

Throughout his career, Jacques has focused on developing technologies that enhance the efficiency and effectiveness of surface detection methods. His innovative approach has positioned him as a forward-thinking inventor in his field.

Collaborations

Jacques Wang has collaborated with notable professionals such as Jeffery Henderson and Patrick Allen Laymon. These partnerships have contributed to the development and refinement of his innovative technologies.

Conclusion

Jacques Wang's work in surface detection technology showcases his dedication to innovation and improvement in manufacturing processes. His contributions, although currently limited in patent count, highlight the potential for future advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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