Savigny Sur Orge, France

Jacques R Des Ordons

This inventor holds 1 USPTO granted patent. Top assignee: Societe Anonyme Dite: Aerospatiale Societe Nationale Industrielle. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jacques R Des Ordons. Retrieved from https://idiyas.com/inventor/jacques-r-des-ordons

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Jacques R Des Ordons: Innovator in Visual Field Measurement

Introduction

Jacques R Des Ordons is a notable inventor based in Savigny Sur Orge, France. He has made significant contributions to the field of visual measurement technology. His innovative approach has led to the development of a unique device that enhances our understanding of visual fields.

Latest Patents

Jacques R Des Ordons holds a patent for a "Device for determining the portion of a field seen by the eye of an observer." This device is designed to accurately determine the portion of a field that is visible to the observer's eye. The invention showcases his commitment to advancing visual technology.

Career Highlights

He is associated with Aerospatiale Société Nationale Industrielle, a prominent company in the aerospace sector. His work there has allowed him to apply his inventive skills in a practical and impactful manner.

Collaborations

Jacques has collaborated with notable colleagues such as Bruno Acier and Jean-Pierre Merle. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Jacques R Des Ordons exemplifies innovation in the field of visual measurement. His contributions continue to influence the industry and enhance our understanding of visual perception.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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