Company Filing History:
Years Active: 1994-1999
Title: Innovations by Jacques Guevremont
Introduction
Jacques Guevremont is a notable inventor based in Montreal, Canada. He has made significant contributions to the field of optical measurement and polymer science. With a total of 2 patents, his work focuses on advanced methods for analyzing materials.
Latest Patents
Guevremont's latest patents include a "Method and apparatus for measurement of absolute biaxial birefringence." This invention describes a system for measuring the birefringence of plastic materials, which must be at least partially transparent. The technique employs a multiwavelength white light source that projects beams at different angles of incidence on the sample. The beams are analyzed to determine the absolute biaxial birefringences for specific wavelengths.
Another significant patent is the "Method and device for evaluation of surface properties, especially." This invention determines the surface molecular orientation of opaque polymeric sheets by detecting the relative intensity of spectral reflectance in polarized beams. The method is efficient and can be applied on-line at high speeds, making it suitable for industrial applications.
Career Highlights
Guevremont works at the National Research Council of Canada, where he has been involved in cutting-edge research and development. His expertise in optical measurement techniques has positioned him as a leader in his field.
Collaborations
He has collaborated with notable colleagues such as Abdellah Ajji and Kenneth C. Cole, contributing to various research projects and innovations.
Conclusion
Jacques Guevremont's contributions to optical measurement and polymer science highlight his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving material analysis techniques, which can have significant implications in various industries.