The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1994

Filed:

Jun. 30, 1993
Applicant:
Inventors:

Kenneth Cole, St. Hubert, CA;

Paolo Cielo, Montreal, CA;

Michel M Dumoulin, Mont. St. Hilaire, CA;

Jacques Guevremont, Montreal, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G61J / ;
U.S. Cl.
CPC ...
2503418 ; 25033907 ; 356369 ;
Abstract

A method and apparatus for determining surface molecular orientation and related properties of an opaque polymeric sheet relies on the detection of relative intensity of spectral reflectance in at least one polarized beam reflected from the surface of the sheet rather than transmitted therethrough. The relative intensity is affected by the preferential orientation of the polymeric chains. The method is fast and can be applied on-line at a speed of the running sheet as high as 1000 m/s.


Find Patent Forward Citations

Cole, Kenneth. (1994). Method and device for evaluation of surface properties, especially (U.S. Patent No. 5365067). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5365067

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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