Jacques F Monier

Title: Innovations of Jacques F Monier

Introduction

Jacques F Monier is a notable inventor based in Torrance, CA. He has made significant contributions to the field of pattern recognition systems. His work focuses on methods and apparatuses that enhance the functionality of optical scanning devices.

Latest Patents

Monier holds a patent for a pattern recognition system. This invention provides a method and related apparatus for finding center lines or center points of distinguishable areas in a scanned field. The technology is particularly useful in the context of integrated-circuit chips. The patent describes circuitry that analyzes a serial digital data stream representative of the scanned image. It determines the positions of center lines and center points of areas within a selected size range. The circuitry includes sections that analyze the scanned image to detect center lines in four separate scanning directions. The outputs of these sections are synchronized and provide a serial output signal indicative of center points. This information can be utilized with a wire bonding machine to indicate the position and orientation of the chip.

Career Highlights

Monier is associated with Excellon Industries, Inc., where he has contributed to advancements in technology. His innovative work has positioned him as a key figure in the development of pattern recognition systems.

Collaborations

Throughout his career, Monier has collaborated with notable individuals such as Walter R Buerger and Kenneth K Dixon. These collaborations have further enriched his contributions to the field.

Conclusion

Jacques F Monier's work in pattern recognition systems exemplifies the innovative spirit of modern technology. His contributions continue to influence the development of optical scanning devices and integrated-circuit technology.