US

Jacques Catinot

This inventor holds 0 USPTO granted patents, plus 3 CIPO patents.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jacques Catinot. Retrieved from https://idiyas.com/inventor/jacques-catinot-s3475038

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

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Title: Jacques Catinot: Innovator in Tire Technology

Introduction

Jacques Catinot is a notable inventor based in the United States, recognized for his innovative contributions to tire technology. He has developed a unique system aimed at enhancing tire tread analysis and brake testing, which is crucial for vehicle safety and performance.

Latest Patents

Jacques Catinot holds a patent for the Modular Tire Tread Analyzing Station. This system is a modular, portable, drive-through tire tread wear and brake testing solution. It includes a tire tread wear analyzer and a flat plate brake tester, all housed within an intermodal cargo shipping container. The design allows vehicles to be driven through the container, where their tires are scanned for tread depth and wear patterns.

Career Highlights

Catinot's career is marked by his dedication to improving vehicle safety through innovative technology. His Modular Tire Tread Analyzing Station provides immediate tire and brake reports, which are essential for maintaining vehicle performance and safety standards. This invention reflects his commitment to advancing automotive technology.

Collaborations

Jacques Catinot has worked alongside notable colleagues, including Roger H. Tracy and Mark Tracy. Their collaboration has contributed to the development and refinement of tire analysis technologies.

Conclusion

Jacques Catinot's work in tire technology exemplifies innovation in automotive safety. His contributions, particularly through the Modular Tire Tread Analyzing Station, highlight the importance of tire maintenance and performance analysis in the automotive industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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