Penfield, NY, United States of America

Jacqueline Holtzman

This inventor holds 1 USPTO granted patent. Top assignee: Xerox Corporation. Active years: 2003.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jacqueline Holtzman

Introduction

Jacqueline Holtzman is a notable inventor based in Penfield, NY (US). He has made significant contributions to the field of digital printing technology. His innovative approach addresses common challenges faced by digital printers, particularly in preserving image quality.

Latest Patents

Holtzman holds a patent for a "System for avoiding image edge deletion in a digital printing apparatus." This invention tackles the issue of image data deletion that can occur at the edges of print sheets. By utilizing an interpreter associated with the printer, the system reduces and translates printed images slightly, ensuring that important image information is not lost. The program reads the job header and determines if image reduction is necessary based on the source computer's identity.

Career Highlights

Holtzman is currently employed at Xerox Corporation, a leader in the field of printing and imaging solutions. His work at Xerox has allowed him to develop and refine technologies that enhance the performance of digital printers. His patent reflects his commitment to improving user experience and print quality.

Collaborations

Throughout his career, Holtzman has collaborated with talented individuals such as Steven Hiroshi Inouye and Kenneth B Schleede. These partnerships have contributed to the advancement of innovative solutions in the printing industry.

Conclusion

Jacqueline Holtzman's contributions to digital printing technology exemplify the impact of innovation in enhancing product performance. His patent demonstrates a practical solution to a common problem, showcasing his expertise and dedication to the field.

Profile summary based on public USPTO records.
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