This inventor holds 1 USPTO granted patent. Top assignee: Northeast Photo Sciences, Inc.. Active years: 1995.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1995
Title: The Innovations of Jacque E Ludman
Introduction
Jacque E Ludman is an accomplished inventor based in Hollis, NH (US). He has made significant contributions to the field of optical measurement through his innovative designs and patents. His work focuses on developing instruments that enhance the accuracy and efficiency of material analysis.
Latest Patents
Jacque E Ludman holds a patent for the Index Interferometric Instrument, which is a highly accurate device used to measure the index of refraction, dispersion, and index profile of materials. This instrument is capable of providing data necessary to measure the index of refraction of materials to five significant figures. It can measure the index profile at any chosen wavelength without requiring sample preparation. The instrument utilizes a light source with a bandwidth ranging from 10 nm to 400 nm, as well as a light source with a bandwidth of less than 10 nm, in combination with an interferometer. Each light source generates interference patterns from the sample and a reference mirror, allowing for precise calculations of the index of refraction at any point on the sample.
Career Highlights
Jacque E Ludman has dedicated his career to advancing optical measurement technologies. His work at Northeast Photo Sciences, Inc. has positioned him as a leader in the field. With a focus on innovation, he has developed instruments that are essential for researchers and industries requiring precise material analysis.
Collaborations
Jacque collaborates with talented professionals in his field, including his coworker Juanita R Riccobono. Their combined expertise contributes to the development of cutting-edge technologies that push the boundaries of optical measurement.
Conclusion
Jacque E Ludman's contributions to the field of optical measurement through his innovative Index Interferometric Instrument exemplify his commitment to advancing technology. His work continues to impact various industries by providing accurate and efficient measurement solutions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile