Mahopac, NY, United States of America

Jacob Savir

This inventor holds 4 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1994-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jacob Savir. Retrieved from https://idiyas.com/inventor/jacob-savir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.3

ph-index = 4

Forward Citations = 110(Granted Patents)


Company Filing History:


Years Active: 1994-1997

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4 patents (USPTO):Explore Patents

Title: Innovations of Jacob Savir

Introduction

Jacob Savir is a notable inventor based in Mahopac, NY (US). He has made significant contributions to the field of electronics and testing methodologies, holding a total of four patents. His work primarily focuses on enhancing the efficiency and accuracy of delay tests in integrated circuits.

Latest Patents

One of Jacob Savir's latest patents is titled "Scan-based delay tests having enhanced test vector pattern generation." This invention teaches circuitry and methods for performing delay tests, including skewed-load, broad-side, and STUMPS-related tests. More particularly, a logic circuit includes at least one block of combinational logic with multiple input nodes and at least one output node. The logic circuit further includes delay test circuitry that is coupled to the input nodes and the output node. The delay test circuitry has a scan-chain register with outputs coupled to the input nodes for establishing multi-bit test vectors. The XOR gates in the circuitry help overcome dependency problems and introduce optimal probabilities for launching transitions during tests.

Another significant patent addresses the "Test and diagnosis of associated output logic for products having embedded arrays." This invention focuses on testing and diagnosing failures in the post-logic of products with embedded arrays. The method involves initializing the array to random values, choosing addresses, and applying random signals at primary inputs. This process continues for a predetermined number of cycles, allowing for effective fault diagnosis.

Career Highlights

Jacob Savir is currently employed at International Business Machines Corporation (IBM), where he continues to innovate and contribute to advancements in technology. His work has been instrumental in improving testing methodologies for integrated circuits.

Collaborations

Some of Jacob's coworkers include Robert Walter Berry, Jr. and Paul H Bardell, Jr. Their collaboration has likely fostered an environment of innovation and creativity within their projects.

Conclusion

Jacob Savir's contributions to the field of electronics and testing methodologies are noteworthy. His patents reflect a commitment to enhancing the performance and reliability of integrated circuits. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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