Jacob Louis Moore

Title: Jacob Louis Moore: Innovator in IC Device Testing

Introduction

Jacob Louis Moore is a notable inventor based in Milton, VT (US). He has made significant contributions to the field of integrated circuit (IC) device testing, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of testing methods for microcircuits.

Latest Patents

One of Jacob's latest patents is the "Clustered Rigid Wafer Test Probe." This invention features an IC device test probe that includes one or more clusters of tapered probe tips. These tips taper upon a taper plane that is orthogonal to the seating direction of the probe toward the IC device. This design allows the probe to seat against multiple contacts, enabling the application of test signals serially or simultaneously. This innovation facilitates electrical characterization of IC devices, particularly those with small pitch configurations.

Another significant patent is the "Compliant Wafer Probe Assembly." This invention comprises a wafer test device that utilizes a conformal laminate and rigid probes to establish electrical connections with microcircuits under test. The device includes a spring plate that enhances the functionality of the probes, ensuring reliable testing of the microcircuits.

Career Highlights

Jacob Louis Moore is currently employed at International Business Machines Corporation (IBM). His role at IBM allows him to further develop his innovative ideas and contribute to advancements in technology.

Collaborations

Throughout his career, Jacob has collaborated with talented individuals such as David Michael Audette and Grant W. Wagner. These collaborations have likely enriched his work and led to the development of impactful inventions.

Conclusion

Jacob Louis Moore is a distinguished inventor whose contributions to IC device testing have made a significant impact in the field. His innovative patents reflect his commitment to advancing technology and improving testing methodologies.