Sartell, MN, United States of America

Jacob L Senn

This inventor holds 1 USPTO granted patent. Top assignee: Target Brands, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jacob L Senn. Retrieved from https://idiyas.com/inventor/jacob-l-senn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Jacob L. Senn

Introduction

Jacob L. Senn is an accomplished inventor based in Sartell, Minnesota. He has made significant contributions to the field of computing devices, particularly with his innovative patent that addresses malfunction monitoring.

Latest Patents

Jacob holds a patent for a "Malfunction Monitor for Computing Devices." This invention involves a processor executing a monitoring module that sends requests to a baseboard management controller. The controller searches for events in an event log and responds to the monitoring module. This response, combined with the current state of the monitoring module, helps determine whether to send an event message to a central controller on a network, indicating a malfunction in the computing device.

Career Highlights

Jacob is currently employed at Target Brands, Inc., where he applies his expertise in technology and innovation. His work focuses on enhancing the reliability and performance of computing devices, contributing to the overall efficiency of the company.

Collaborations

Jacob has collaborated with notable coworkers, including Jena L. Boerum and Thomas J. Kimlinger. Their combined efforts in the field of technology have fostered a creative environment that encourages innovation.

Conclusion

Jacob L. Senn exemplifies the spirit of innovation through his work and patent contributions. His dedication to improving computing devices showcases the importance of inventors in advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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