This inventor holds 2 USPTO granted patents. Top assignee: Xerox Corporation. Active years: 2002-2005.
Company Filing History:
Years Active: 2002-2005
Title: Jack Whipple: Innovator in Print Quality Analysis
Introduction
Jack Whipple is a notable inventor based in North Rose, NY (US). He has made significant contributions to the field of print quality analysis, holding a total of 2 patents. His work focuses on developing systems that enhance the quality and reliability of printed images.
Latest Patents
Whipple's latest patents include a "Method and system for print quality analysis" and a "Method and system for analyzing imaging problems." The first patent discloses a system for detecting defects in a printed image to analyze print quality of printers or copiers. This system scans the printed image and compares the obtained data with the original image data. It operates in a closed loop manner, allowing for automatic feedback to a control unit, where a processor detects defects in the printed image. The system also analyzes comparison results to identify any skew in the printed image. The second patent focuses on detecting defects in printed images to analyze imaging problems in an image reproducing apparatus. Similar to the first, it scans the printed image and compares the data with the original. This system determines whether the intermediate imaging member needs replacement based on the comparison results.
Career Highlights
Jack Whipple is currently employed at Xerox Corporation, a leading company in the field of printing and imaging technology. His work at Xerox has allowed him to develop innovative solutions that address common issues in print quality and imaging.
Collaborations
Whipple collaborates with William M. OuYang, contributing to advancements in print technology and quality analysis.
Conclusion
Jack Whipple's contributions to print quality analysis through his innovative patents have significantly impacted the printing industry. His work continues to enhance the reliability and quality of printed materials.
