Jacek Lagowski

Title: Jacek Lagowski: Innovator in Semiconductor Technology

Introduction

Jacek Lagowski is a notable inventor based in Woburn, MA (US), recognized for his contributions to semiconductor technology. With a total of 3 patents, he has made significant advancements in evaluating the crystalline properties of semiconductor materials.

Latest Patents

Lagowski's latest patents focus on methods to determine the crystalline quality of semiconductor materials at their interfaces with insulators. One of his patents describes a method where the crystalline quality is evaluated by the photovoltage response to a light beam scanned in wavelength. This innovative approach utilizes a body of silicon-on-sapphire (SOS) to illustrate the method. Another patent outlines a technique for optically evaluating the crystalline quality by analyzing a reflected light beam scanned in wavelength. The refractive index of the material at or near the interface is calculated from the measured values of reflectivity extrema, providing insights into the crystalline quality at the interface.

Career Highlights

Lagowski has built a career centered around semiconductor research and development. His work has contributed to a deeper understanding of the properties of semiconductor materials, which is crucial for advancements in electronics and photonics.

Collaborations

Throughout his career, Lagowski has collaborated with various professionals in the field, including his coworker Lubomir L. Jastrzebski. These collaborations have fostered innovation and the sharing of knowledge in semiconductor technology.

Conclusion

Jacek Lagowski's work in semiconductor technology exemplifies the importance of innovation in evaluating material properties. His patents reflect a commitment to advancing the field and enhancing the understanding of semiconductor interfaces.