This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ev Group E. Thallner Gmbh. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Jacek Gasiorowski: Innovator in Substrate Measurement Technology
Introduction
Jacek Gasiorowski is a notable inventor based in Schärding, Austria. He has made significant contributions to the field of substrate measurement technology. His innovative approach has led to the development of a unique method for measuring multilayered substrates.
Latest Patents
Jacek holds 1 patent for his invention titled "Device and method for measuring a substrate." This patent outlines a comprehensive method for measuring a multilayered substrate, particularly one that includes structures with critical dimensions. The method involves several steps, including producing the substrate, measuring it using various technologies, creating simulations based on measurement results, and optimizing these simulations to ensure accuracy.
Career Highlights
Jacek Gasiorowski is currently employed at Ev Group E. Thallner GmbH, where he applies his expertise in substrate measurement. His work has been instrumental in advancing the company's technological capabilities. He collaborates closely with his coworker, Markus Wimplinger, to drive innovation within the organization.
Collaborations
Due to space constraints, the collaborations section will be omitted.
Conclusion
Jacek Gasiorowski's contributions to substrate measurement technology exemplify his innovative spirit and dedication to advancing the field. His patent and work at Ev Group E. Thallner GmbH highlight his role as a key player in this area of technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile