Company Filing History:
Years Active: 1991-2024
Title: Jaap Boksem: Innovator in X-ray Analysis Technology
Introduction
Jaap Boksem is a notable inventor based in Almelo, Netherlands. He has made significant contributions to the field of X-ray analysis, holding a total of 4 patents. His work focuses on enhancing the efficiency and accuracy of X-ray analysis apparatuses.
Latest Patents
Boksem's latest patents include a sample mounting system for an X-ray analysis apparatus. This innovative system comprises a sample holder and a sample stage with a platform designed to support the sample holder. The sample can be securely fixed to the sample holder using a mount. The sample holder features a holder reference portion that aligns with a corresponding reference portion of the sample stage, ensuring precise alignment during analysis.
Another significant patent is for an X-ray analysis apparatus and method. This apparatus includes an X-ray source that irradiates a sample with an incident X-ray beam. A first beam mask component is strategically placed between the X-ray source and the sample, featuring a first opening to limit the size of the incident X-ray beam. The first beam mask component can be configured to switch between two settings, allowing for flexibility in the analysis process.
Career Highlights
Throughout his career, Jaap Boksem has worked with prominent companies such as Malvern Panalytical B.V. and U.S. Philips Corporation. His experience in these organizations has contributed to his expertise in developing advanced X-ray analysis technologies.
Collaborations
Boksem has collaborated with notable professionals in his field, including Detlef Beckers and Milen Gateshki. These partnerships have further enriched his work and innovations in X-ray analysis.
Conclusion
Jaap Boksem's contributions to X-ray analysis technology through his patents and collaborations highlight his role as a significant innovator in the field. His work continues to influence advancements in analytical techniques and equipment.