Silver Spring, MD, United States of America

J Thomas Armstrong

This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 2007.


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: J Thomas Armstrong: Innovator in Fourier Transform Spectrometry

Introduction

J Thomas Armstrong is a notable inventor based in Silver Spring, MD (US). He has made significant contributions to the field of optical engineering, particularly through his innovative work on Fourier Transform Spectrometry. His expertise and inventions have advanced the capabilities of spectrometric analysis.

Latest Patents

Armstrong holds a patent for a Dispersed Fourier Transform Spectrometer. This invention features a Fourier Transform Spectrometer that receives source light and outputs multiple narrowband interferogram outputs of different wavelengths. The design incorporates a dispersive element that enhances the sensitivity of standard Fourier Transform Spectrometers. By applying a sparse sampling algorithm, the device optimizes the model interferogram to best match the data interferogram, significantly improving the signal-to-noise ratio.

Career Highlights

Armstrong is currently represented by the Secretary of the Navy in the USA. His work has been instrumental in developing advanced spectrometric technologies that are crucial for various applications in research and industry. His innovative approach has set new standards in the field.

Collaborations

Armstrong has collaborated with notable colleagues, including Arsen R Hajian and David Mozurkewich. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

J Thomas Armstrong's contributions to the field of Fourier Transform Spectrometry exemplify the impact of innovative thinking in technology. His work continues to influence advancements in optical engineering and spectrometric analysis.

Profile summary based on public USPTO records.
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