Six Mile, SC, United States of America

J Scott McCall


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 57(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: J Scott McCall: Innovator in Capacitor Technology

Introduction

J Scott McCall is a notable inventor based in Six Mile, South Carolina. He has made significant contributions to the field of capacitor technology, particularly through his innovative methods for creating anode foil plates. His work has implications for the efficiency and performance of layered electrolytic capacitors.

Latest Patents

J Scott McCall holds a patent for a "Method for making anode foil for layered electrolytic capacitor." This patent describes a process that involves using high purity aluminum foil to generate anode foil plates. The sheets of foil are highly etched to create a very high surface area. After the etching process, the foil is partially cut or punched into plates that are shaped to fit the finished capacitor housing. The process ensures that the edges of the formed anode plates do not require reforming during capacitor aging and eliminates particulates at the cut edges.

Career Highlights

Throughout his career, McCall has been associated with Pacesetter, Inc., where he has applied his expertise in capacitor technology. His innovative methods have contributed to advancements in the manufacturing processes of capacitors, enhancing their reliability and performance.

Collaborations

J Scott McCall has worked alongside notable colleagues such as Benjamin D Pless and William H Elias. Their collaborative efforts have furthered the development of capacitor technologies and have led to significant advancements in the field.

Conclusion

J Scott McCall's contributions to the field of capacitor technology through his innovative patent demonstrate his commitment to advancing electrical engineering. His work continues to influence the design and manufacturing of capacitors, ensuring improved performance and reliability in various applications.

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