This inventor holds 3 USPTO granted patents. Top assignee: Lockheed Martin Corporation. Active years: 2013-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013-2016
Title: J Richard Wood: Innovator in X-ray Technology
Introduction
J Richard Wood is a notable inventor based in Grapevine, TX (US). He has made significant contributions to the field of X-ray technology, holding a total of 3 patents. His work focuses on advanced imaging techniques that enhance material characterization.
Latest Patents
One of his latest patents is titled "X-ray backscatter detection using modulated X-rays." This invention involves generating an X-ray signal that is modulated with at least two radio frequency modulation signals. The modulated X-ray signal is directed toward a target material, and a backscatter signal is received, which includes harmonic components generated by the target material. Based on these harmonic components, a characteristic of the target material can be identified.
Another significant patent is the "3D X-ray microscopy imaging system." This patent presents a technique for 3D X-ray microscopy imaging. It includes various embodiments of an apparatus for use in this technique, such as an X-ray microscopy imaging system. The method generates an X-ray image that has a grayscale response proportional to range, with some aspects being computer-implemented.
Career Highlights
J Richard Wood is currently employed at Lockheed Martin Corporation, where he continues to innovate in the field of X-ray technology. His work has contributed to advancements in imaging systems that are crucial for various applications.
Collaborations
Throughout his career, J Richard Wood has collaborated with notable colleagues, including Mark K Browder and William B Shores. These collaborations have further enhanced the development of his innovative technologies.
Conclusion
J Richard Wood is a prominent inventor whose work in X-ray technology has led to significant advancements in material characterization and imaging techniques. His contributions continue to impact the field positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
