This inventor holds 1 USPTO granted patent. Top assignee: Georgia Tech Research Corporation. Active years: 1995.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1995
Title: J Craig Wyvill: Innovator in X-ray Monitoring Systems
Introduction
J Craig Wyvill is a notable inventor based in Atlanta, GA (US). He has made significant contributions to the field of X-ray technology, particularly in the food industry. His innovative approach has led to the development of a unique system that enhances the safety and quality of poultry products.
Latest Patents
Wyvill holds a patent for an X-ray monitoring system. This invention is a method and apparatus designed to identify and pinpoint the location of unwanted pieces of material or defects in de-boned poultry pieces. The system operates by carrying the poultry pieces on a conveyor, which then passes them under an impinging collimated X-ray beam. The resulting Rayleigh scattering is detected and measured, along with the Compton back scattering. The data is processed in a unit to determine the location and type of foreign matter involved. The ratio of Rayleigh and Compton scattering is also analyzed to verify the identity of the foreign material. Additionally, transmitted X-rays, or radioscopy, are utilized to normalize the data and assist in pinpointing the location of unwanted materials.
Career Highlights
Wyvill is associated with the Georgia Tech Research Corporation, where he continues to innovate and contribute to advancements in technology. His work has implications not only for food safety but also for various applications in material inspection.
Collaborations
Some of his notable coworkers include Chris D Papanicolopoulos and Wayne D Daley, who have collaborated with him on various projects.
Conclusion
J Craig Wyvill's contributions to X-ray monitoring systems exemplify the importance of innovation in ensuring food safety and quality. His patented technology represents a significant advancement in the field, showcasing his dedication to improving industry standards.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
