J Broc Stirton

Title: J Broc Stirton - An Innovator in Process Control and Metrology

Introduction

J Broc Stirton, based in Austin, TX, is a notable inventor with an impressive portfolio of five patents to his name. His work primarily focuses on advancements in process control and metrology, showcasing his commitment to innovation in the technology sector.

Latest Patents

Stirton's latest patents include groundbreaking methodologies that enhance manufacturing processes. One of his notable inventions is a patent titled "Tuning a process controller based on a dynamic sampling rate." This method involves estimating the state of a manufacturing process by collecting metrology data from a subset of workpieces. The approach acknowledges irregular patterns in data collection and involves determining a tuning factor to refine state estimates, ultimately improving control over the process tools.

Another significant patent is "Method and apparatus for determining grid dimensions using scatterometry." This innovative method involves a test structure with intersecting lines that define a grid with openings. By illuminating portions of the grid and measuring the reflected light, Stirton's method enables precise determination of grid dimensions, showcasing a significant advancement in metrology tools.

Career Highlights

Throughout his career, J Broc Stirton has made significant contributions while working with leading companies in the semiconductor industry. Notably, he has been associated with Advanced Micro Devices Corporation and Globalfoundries Inc., where he has utilized his expertise to drive innovation and enhance manufacturing efficiencies.

Collaborations

Stirton's work has also included collaborations with other professionals in the field. He has partnered with colleagues such as Richard J Markle and Kevin R Lensing, contributing to a collaborative environment that fosters creativity and innovation in technology.

Conclusion

J Broc Stirton's inventions and patents reflect his dedication to innovation in the world of process control and metrology. With a solid foundation of experience and an impressive list of patents, his contributions continue to influence the development of advanced manufacturing technologies.