Company Filing History:
Years Active: 2025
Title: Izhar Agam: Innovator in Metrology Systems
Introduction
Izhar Agam is a notable inventor based in Milpitas, CA, who has made significant contributions to the field of metrology systems. His innovative work focuses on enhancing the precision and efficiency of wafer measurement processes.
Latest Patents
Izhar Agam holds a patent for an "Oscillating Secondary Stage for Frame-Mode Overlay Metrology." This invention features an oscillating secondary stage within a metrology system. The primary stage is designed for long movements to transport a wafer from one location to another. The secondary stage, which is coupled to the primary stage, holds the wafer and is configured to oscillate between two directions. This oscillation allows for capturing an image frame of the wafer at a target location while the primary stage is in motion. He has 1 patent to his name.
Career Highlights
Izhar Agam is currently employed at Kla Corporation, a company renowned for its advanced semiconductor manufacturing equipment. His work at Kla Corporation has positioned him as a key player in the development of innovative metrology solutions.
Collaborations
Izhar has collaborated with notable colleagues, including Andrew V Hill and Yoram Uziel, who share his commitment to advancing technology in the semiconductor industry.
Conclusion
Izhar Agam's contributions to metrology systems exemplify the impact of innovative thinking in technology. His patent and work at Kla Corporation highlight his role in shaping the future of semiconductor manufacturing.