Nagano, Japan

Iwao Kakegawa

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Fujitsu Corporation. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Iwao Kakegawa. Retrieved from https://idiyas.com/inventor/iwao-kakegawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Iwao Kakegawa: Inventor in Three-Dimensional Graphics

Introduction

Iwao Kakegawa is an inventor associated with Nagano, Japan, and Fujitsu Corporation. His work includes a patented system and method for displaying three-dimensional graphics.

Latest Patents

Kakegawa is credited with 1 patent: “Three-dimensional graphic displaying system and method.” The invention enables the viewpoint of a displayed graphic to change as the graphic is rotated or moved. It generates scale-mark data for coordinate axes using combinations of lines on planes perpendicular to those axes, converts the data according to the user’s viewpoint, and displays it as a two-dimensional image. This approach helps users identify scale-mark positions even when their viewpoint lies along an extended portion of a scale mark.

Career Highlights

Kakegawa’s patent addresses the challenge of keeping coordinate scale marks identifiable as a user’s viewpoint changes. The disclosed system combines data generation, viewpoint conversion, and display processing to support interactive three-dimensional graphics.

Collaborations

Kakegawa is associated with Fujitsu Corporation. His listed coworkers include Kouzo Nagano and Yasuyuki Hikosaka.

Conclusion

Iwao Kakegawa’s patented work focuses on making scale marks easier to interpret in three-dimensional graphics as users rotate or move displayed objects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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