This inventor holds 1 USPTO granted patent. Top assignee: Sv Probe Pte. Ltd.. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: Ivan Pipps - Innovator in Probe Technology
Introduction
Ivan Pipps is a notable inventor based in Queen Creek, AZ (US). He has made significant contributions to the field of probe technology, particularly through his innovative methods for shaping and cleaning probe tips. His work has implications for various testing machinery, enhancing efficiency and reducing costs.
Latest Patents
Ivan Pipps holds a patent for a "Method of probe tip shaping and cleaning." This patent outlines methods for shaping, maintaining the shape of, and cleaning a probe tip using a multi-layer adhesive and abrasive pad. The pad is designed to be formed from layers of adhesive material with abrasive particles in between each layer. This innovative approach allows for the shaping of probe tips from unfinished probe stock, significantly limiting the need for expensive conventional machining operations. Additionally, the pad can maintain probe tips in a desired operating shape and clean accumulated debris from the probe tip. The maintenance and cleaning operations are preferably performed on-line, with the probes operatively installed in connection with testing machinery.
Career Highlights
Ivan Pipps is associated with Sv Probe Pte. Ltd., where he applies his expertise in probe technology. His work at the company has been instrumental in advancing the capabilities of probe systems used in various applications.
Collaborations
Ivan has collaborated with notable coworkers, including Son N Dang and Gerry Back. Their combined efforts contribute to the innovative environment at Sv Probe Pte. Ltd.
Conclusion
Ivan Pipps is a distinguished inventor whose work in probe technology has led to significant advancements in the field. His innovative methods for shaping and cleaning probe tips demonstrate his commitment to improving efficiency and reducing costs in testing machinery.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
