Hamana-gun, Japan

Isao Ohta

This inventor holds 1 USPTO granted patent. Top assignee: Asmo Co., Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Isao Ohta. Retrieved from https://idiyas.com/inventor/isao-ohta-241ndfx7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations by Isao Ohta in Wiper Technology.

Introduction

Isao Ohta is a notable inventor based in Hamana-gun, Japan. He has made significant contributions to the field of wiper technology, particularly through his innovative designs and methods.

Latest Patents

Ohta holds a patent for a wiper strip, wiper blade, and a designing method of the wiper strip. This patent focuses on the relationship between the thickness of a water film at the location of maximum pressing pressure and the maximum pressure gradient value. By deducing this relationship, Ohta has determined the corresponding design factors of a wiper blade. His invention ensures that the thickness of the water film immediately after wiping falls within an appropriate range, enhancing the efficiency of wiper blades.

Career Highlights

Ohta is associated with Asmo Co., Ltd., where he has been able to apply his innovative ideas in practical applications. His work has contributed to advancements in automotive technology, particularly in improving visibility during adverse weather conditions.

Collaborations

Ohta has collaborated with Masaaki Kiyama, another professional in the field, to further enhance the development of wiper technology.

Conclusion

Isao Ohta's contributions to wiper technology through his patent and collaboration with industry professionals highlight his role as an influential inventor. His work continues to impact the automotive industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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