Tokyo, Japan

Isao Motomura

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Semiconductor Limited. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Isao Motomura. Retrieved from https://idiyas.com/inventor/isao-motomura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Isao Motomura: A Pioneer in Semiconductor Inspection Technology

Introduction: Isao Motomura, an accomplished inventor based in Shinjuku-ku, Japan, has made significant contributions to the field of semiconductor manufacturing. With a focus on enhancing defect inspection processes, Motomura holds a key patent that showcases his ingenuity and dedication to innovation.

Latest Patents: Isao Motomura's notable patent is titled "Defect inspection apparatus, defect inspection method, and manufacture method for semiconductor device." This invention addresses the critical need for effective defect detection in semiconductor wafers. The apparatus includes a distinguishing size for distinguishing a pseudo defect from a defect caused by process troubles, which is stored in a first storage area. Additionally, defect data is stored in a second storage area. The processing unit detects defects on the wafer's surface, and if a defect detected has a size equal to or larger than the distinguishing size, an alarm is activated. This innovative approach optimizes the defect detection process and enhances the overall quality of semiconductor devices.

Career Highlights: Isao Motomura has dedicated his career to research and development in the semiconductor industry. He works at Fujitsu Semiconductor Limited, where he applies his expertise to further advancements in semiconductor technology. His contributions have been instrumental in improving defect inspection methods, aligning with industry standards for quality and reliability.

Collaborations: Throughout his career, Motomura has collaborated with fellow innovator Naohiro Takahashi. Together, they have contributed to projects that enhance semiconductor fabrication processes, leveraging their combined skills to push technological boundaries within the industry.

Conclusion: Isao Motomura exemplifies the spirit of innovation in the field of semiconductor manufacturing. His contributions, particularly through his patent on defect inspection methods, have paved the way for improved quality assurance in semiconductor devices. As he continues to develop new technologies at Fujitsu Semiconductor Limited, Motomura’s work remains vital to the evolution of the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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