Tokyo, Japan

Isamu Ishikawa


 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020-2025

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2 patents (USPTO):Explore Patents

Title: Isamu Ishikawa: Innovator in Charged Particle Beam Systems

Introduction

Isamu Ishikawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam systems, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of data acquisition in various applications.

Latest Patents

Ishikawa's latest patents include a charged particle beam system and a control method designed to prevent the data acquisition time from increasing. This innovative system features a beam blanker for controlling the charged particle beam, a sample stage that can be tilted, and a blanking controller that directs a pulsed beam at the sample. The tilt controller adjusts the sample's tilt angle, allowing for optimized data collection.

Another notable patent is a three-dimensional image reconstruction method, which involves obtaining transmission electron microscope images of samples containing membrane proteins. This method analyzes the three-dimensional structure of these proteins by utilizing images taken from different angles, providing valuable insights into their orientations and structures.

Career Highlights

Throughout his career, Ishikawa has worked with esteemed organizations such as Jeol Ltd. and Nagoya University. His experience in these institutions has allowed him to develop and refine his innovative technologies, contributing to advancements in the field of electron microscopy and charged particle beam systems.

Collaborations

Ishikawa has collaborated with notable colleagues, including Takeshi Kaneko and Eiji Okunishi. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise, further enhancing the impact of their work.

Conclusion

Isamu Ishikawa's contributions to the field of charged particle beam systems and electron microscopy demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in data acquisition and image reconstruction, making him a significant figure in his field.

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