Oak Park, IL, United States of America

Isabel Walther Firpo

This inventor holds 2 USPTO granted patents. Top assignee: Welch Allyn, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Isabel Walther Firpo. Retrieved from https://idiyas.com/inventor/isabel-walther-firpo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 33(Granted Patents)


Location History:

  • Oak Park, IL (US) (2018)
  • Skaneateles Falls, NY (US) (2018)

Company Filing History:


Years Active: 2018

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2 patents (USPTO):Explore Patents

Title: The Innovations of Isabel Walther Firpo

Introduction

Isabel Walther Firpo is a notable inventor based in Oak Park, Illinois. She has made significant contributions to the field of optical imaging, holding a total of 2 patents. Her work has been instrumental in advancing technology in this area.

Latest Patents

Isabel's latest patents include an innovative optical imaging device. This invention showcases her expertise and commitment to enhancing imaging technology, which has applications in various fields.

Career Highlights

Isabel is currently employed at Welch Allyn, Inc., a company known for its medical diagnostic equipment. Her role at the company allows her to apply her inventive skills in a practical setting, contributing to the development of advanced medical technologies.

Collaborations

Throughout her career, Isabel has collaborated with talented individuals such as Thomas A. Myers and Richard M. Farchione. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Isabel Walther Firpo's contributions to optical imaging technology and her collaborations with esteemed colleagues highlight her impact in the field. Her work continues to inspire future innovations in medical technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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