Portland, OR, United States of America

Isaac S Simpson

This inventor holds 2 USPTO granted patents. Top assignee: Airadvice, Inc.. Active years: 2006-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Isaac S Simpson. Retrieved from https://idiyas.com/inventor/isaac-s-simpson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2006-2009

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2 patents (USPTO):Explore Patents

Title: Innovations of Isaac S. Simpson

Introduction

Isaac S. Simpson is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of particle sizing technology. With a total of 2 patents, his work has advanced the understanding and application of particle size measurement.

Latest Patents

Isaac's latest patents include a "Particle Sizing Refinement System." This system specifies a plurality of particle size reference values, from which data is obtained based at least in part on these specified values. The refinement system enhances the accuracy of particle size data, ensuring more reliable results in various applications.

Career Highlights

Isaac S. Simpson is currently employed at Airadvice, Inc., where he continues to innovate and develop new technologies. His work at the company has positioned him as a key figure in the advancement of air quality monitoring and analysis.

Collaborations

Throughout his career, Isaac has collaborated with talented individuals such as Steven J. Carnegie and Meindert J. Kleefstra. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Isaac S. Simpson's contributions to particle sizing technology and his collaborative efforts at Airadvice, Inc. highlight his importance in the field of innovation. His work continues to influence advancements in air quality monitoring and measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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