Palo Alto, CA, United States of America

Irving Lee

This inventor holds 3 USPTO granted patents. Top assignee: Abbott Diabetes Care Inc.. Active years: 2011-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Irving Lee. Retrieved from https://idiyas.com/inventor/irving-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2011-2014

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3 patents (USPTO):Explore Patents

Title: The Innovations of Irving Lee

Introduction

Irving Lee is a notable inventor based in Palo Alto, California, recognized for his contributions to the field of analyte monitoring devices. With a total of three patents to his name, he has made significant advancements in the technology used for analyzing biological samples.

Latest Patents

One of Irving Lee's latest patents is an integrated meter for analyzing biological samples. This invention provides analyte monitoring devices and methods that integrate various functions of analyte monitoring, including sample acquisition and testing. This innovative approach enhances the efficiency and accuracy of biological sample analysis.

Career Highlights

Irving Lee is currently employed at Abbott Diabetes Care Inc., a company known for its commitment to developing advanced diabetes care solutions. His work at Abbott has allowed him to focus on creating technologies that improve the lives of individuals managing diabetes.

Collaborations

Irving has collaborated with notable colleagues such as Philip Bryer and Stephen J. Schoenberg, contributing to the development of innovative solutions in the field of diabetes care.

Conclusion

Irving Lee's work exemplifies the impact of innovation in healthcare technology, particularly in the realm of diabetes management. His patents and collaborations continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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