Bloomfield, NJ, United States of America

Irvin Shuster

This inventor holds 2 USPTO granted patents. Top assignee: Oracle International Corporation. Active years: 2017-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Irvin Shuster. Retrieved from https://idiyas.com/inventor/irvin-shuster

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2017-2018

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2 patents (USPTO):Explore Patents

Title: Irvin Shuster: Innovator in Talent Management Metrics

Introduction

Irvin Shuster is a notable inventor based in Bloomfield, NJ (US). He has made significant contributions to the field of talent management through his innovative patents. With a total of 2 patents, Shuster's work focuses on providing predictive metrics that enhance employment position analysis.

Latest Patents

Shuster's latest patents include methods and systems for providing predictive metrics in a talent management application. These techniques involve receiving data related to various employment positions from multiple customers. The computing device aggregates this data and determines statistics based on the employment positions. Ultimately, it generates predictive metrics that assist in understanding employment trends and requirements.

Career Highlights

Irvin Shuster is currently employed at Oracle International Corporation, where he continues to develop innovative solutions in the realm of talent management. His expertise in predictive metrics has positioned him as a valuable asset in his field.

Collaborations

Shuster has collaborated with notable coworkers, including Sharad Thankappan and Samar Lotia, contributing to the advancement of their projects and initiatives.

Conclusion

Irvin Shuster's contributions to talent management through his patents demonstrate his commitment to innovation and excellence. His work continues to influence the way organizations approach employment metrics and analytics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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