Paderborn, Germany

Irina Baum

This inventor holds 1 USPTO granted patent. Top assignee: Dspace Se & Co. Kg. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Irina Baum. Retrieved from https://idiyas.com/inventor/irina-baum

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Irina Baum and Her Patent in Control-Device Testing.

Introduction

Irina Baum is an inventor associated with Paderborn, Germany, and dSPACE SE & Co. KG. Her work includes a patented test assembly designed to support the testing of control devices by manipulating messages before they reach the device.

Latest Patents

The provided information lists one patent for Baum: “Testing a Control Device Using a Test Assembly.” The invention describes a system that receives a message in fragments, stores them in a buffer according to identifiers, and allows the complete message to be manipulated before its first fragment is sent to a control device. A manipulator modifies the message based on predetermined data, and a transmitter sends the modified message to the device. This approach enables controlled testing of how a control device responds to altered messages. Baum is credited with 1 patent.

Career Highlights

Baum’s listed patent focuses on test infrastructure for control devices. By coordinating message fragments in a buffer, the assembly makes it possible to modify a message before transmission, supporting systematic testing of device behavior.

Collaborations

The provided information identifies Remigiusz Seiler as Baum’s coworker and dSPACE SE & Co. KG as her company.

Conclusion

Irina Baum’s patent describes a message-manipulation test assembly for control devices, reflecting an engineering contribution to controlled and systematic device testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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